124 Results For

"cerium rare earth oxide"

Qualité CeO2 à base d'eau Slurry de polissage chimique mécanique pour l'élimination des défauts du verre Usine

CeO2 à base d'eau Slurry de polissage chimique mécanique pour l'élimination des défauts du verre

Polishing Slurry For Float Glass Surface Defect RemovalDescriptionLichen Polishing Slurry for Float Glass Surface Defect Removal is a cerium oxide-based slurry specifically formulated to effectively remove surface defects from float glass. Whether addressing scratches, water spots, haze, or micro-defects, our slurry delivers superior material removal rates and enhances surface clarity, making it ideal for both manufacturing and post-production glass surface restoration

Qualité Panel LCD sous nanomètre pour polissage chimique mécanique personnalisé Usine

Panel LCD sous nanomètre pour polissage chimique mécanique personnalisé

Customized Polishing Slurry for LCD Panel Manufacturing Description Engineered for the stringent demands of display technologies, our customized cerium oxide slurries provide the high-precision finishing required for high-generation LCD and liquid crystal glass substrates. As automotive and consumer electronics move toward ultra-thin and curved profiles, our slurries deliver the sub-nanometer flatness and surface integrity essential for uniform light transmission. Core

Qualité 2.2μM Ph Polissage neutre CMP Slurry pour les substrats de plaquettes de verre Usine

2.2μM Ph Polissage neutre CMP Slurry pour les substrats de plaquettes de verre

CMP Slurry For Glass Wafer Substrates Description Lichen CMP Slurry for Glass Wafer Substrates is a high-purity, ready-to-use polishing slurry formulated for precision chemical-mechanical planarization (CMP) of glass wafer substrates. Designed for the advanced semiconductor, photonics, and microelectronics industries, this slurry ensures optimal material removal, uniform surface polishing, and low defect density, meeting the strict requirements for high-performance glass

Qualité Slurry Nano Ceria CMP de haute pureté (taille de particule 200 nm) conçu pour les semi-conducteurs Usine

Slurry Nano Ceria CMP de haute pureté (taille de particule 200 nm) conçu pour les semi-conducteurs

High-purity Nano Ceria CMP Slurry (200nm Particle Size) Designed For Semiconductor Descripti on High-purity nano ceria CMP slurry (100nm particle size) designed for semiconductor and advanced surface finishing. Stable dispersion, high removal rate, and ultra-low surface defects. It is ideal for next-generation precision polishing processes demanding nanometer-level surface control. Key Features & Advantages Nano-Scale Precision Polishing The 100 nm ceria particles enable

Précédent Suivant
Précédent
Page 11 de 11
Suivant